A 3-Bit 2.2V 3.08pJ/Conversion-Step 11GS/s Flash ADC in A 0.12μm SiGe BiCMOS Technology
نویسندگان
چکیده
A 3-bit ADC for X-band applications that can work at a sampling rate of 11 GS/s is presented in this paper. Current comparators are used to achieve the high sampling rate of 11 GHz at X-band. A 3-bit current-steering DAC is also designed for testing the high-speed ADC. The ADC-DAC RFIC is implemented in a 0.12 μm SiGe technology and occupies a core area of 1.0 x 0.8 mm. The ADC can operate with a FOM of 3.08 pJ/conversion-step, consuming 0.22 W power with a 2.2 V power supply. It demonstrates a good performance at X-band sampling rate with the lowest power supply voltage, lowest power consumption, smallest core area and best FOM reported so far. The ADC-DAC RFIC is tested in a 44-pin CLLC package and achieves a peak SFDR of 28 dBc and a peak ENOB of 2.7 bits at 11 GS/s sampling rate. Index Terms — flash, analog-to-digital converter (ADC), digital-to-analog converter (DAC), low power, low voltage, X-band, current comparator, SiGe, BiCMOS.
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